Semiconductor buyers guide, directory and reference site.
Aystorm Scientific Ltd - Auger Electron Spectroscopy (AES) Suppliers
Company : Aystorm Scientific Ltd
Address 1 : Richmond House
Address 2 : Mersey Rd
City : Sale
State :
Post/Zip Code : M33 6BB
Country : United Kingdom
Phone : +44 (0)161 481 1183
Fax : +44 (0)161 968 8123
Email : info@aystorm.com
Description :
Materials characterisation & surface analysis services. Specialising in ion beam analysis including SIMS, ule SIMS, Auger, XPS, RBS, TEM and surface contamination (TOF SIMS, VPD-TXRF, VPD-ICPMS).
Providing support and advanced anaytical serviecs for development of various thin films and nano layers, semiconductor, photovoltaic materials, optical coatings, reverse engineering and as an expert witness in cases involving patent infringement, and product claim.
Products
This section is currently empty.
Literature
This section is currently empty.
Categories
- Manufacturing Services > Test, Measurement & Analysis > Atomic Force Microscopy (AFM)
- Manufacturing Services > Test, Measurement & Analysis > Auger Electron Spectroscopy (AES)
- Manufacturing Services > Test, Measurement & Analysis > Dopant Depth Profiling
- Manufacturing Services > Test, Measurement & Analysis > Failure Analysis
- Manufacturing Services > Test, Measurement & Analysis > Focused Ion Beam (FIB)
- Manufacturing Services > Test, Measurement & Analysis > Materials Analysis
- Manufacturing Services > Test, Measurement & Analysis > Microscopy
- Manufacturing Services > Test, Measurement & Analysis > Organic Analysis
- Manufacturing Services > Test, Measurement & Analysis > Scanning Electron Microscopy (SEM)
- Manufacturing Services > Test, Measurement & Analysis > Secondary Ion Mass Spectroscopy (SIMS)
- Manufacturing Services > Test, Measurement & Analysis > Surface Analysis
- Manufacturing Services > Test, Measurement & Analysis > Thin Film Characterization
- Manufacturing Services > Test, Measurement & Analysis > Transmission Electron Microscopy (TEM)
- Manufacturing Services > Test, Measurement & Analysis > X-Ray Inspection
SITE SPONSORS
- Contact us |
- Terms of use |
- Privacy policy |
- Site Map |
© Semi-Directory 2013