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Solid State Measurements, Inc. - Capacitance-to-Voltage (C-V) Probe System Suppliers
Company : Solid State Measurements, Inc.
Address 1 : 110 Technology Dr.
Address 2 :
City : Billerica
State : PA
Post/Zip Code : 01821
Country : United States
Phone : +1 508 647 84
Fax :
Email : han.c.chang@semilab.com
Industry Memberships:
Description :
SSM products measure the electrical properties of semiconductor wafers. NeoMetriK non-contact microwave systems measure dielectric constant and etch/cleaning damage of low-k dielectrics. NanoSRP spreading resistance systems measure depth profiles of epi, ultra-shallow junction implants, and diffusion. HgCV systems measure low-k, epi, silicon carbide and low temperature TFT flat panel displays. FastGate systems measure thickness, leakage current, and interface trap density on advanced gate dielectrics and surface dopant density and carrier profiles of implants.
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