International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

TestWeek's comprehensive program includes papers, panels, lectures and advanced industrial practice sessions, tutorials, workshops, and the return of the famed poster session followed by a Texas-style beer blast. In addition to focused papers on hot topics such as test compression, power-aware test, advances in delay test, and silicon debug, new this year are four embedded tutorials on topics including testing of 3D chips, new boundary-scan standards and post-silicon validation. Also new is a special Career Track hosted by IEEE-USA.