Measurement Equipment

Category	# of Listings
Air Velocity Meter (VA)	0
Analytical Equipment	51
Bench Top Tests	12
Calibration Standards	17
Capacitance-to-Voltage (C-V) Plotters	1
Capacitance-to-Voltage (C-V) Probe Systems	7
Chart Recorder / Plotters	0
Chromatography	5
Computer Aided Measuring and Analysis (CAMA)	1
Contour Mapping Systems	1
Defect / Particle Detection or Inspection	37
Deposition Rate Monitors	4
Ellipsometers	5
Endpoint Detectors	6
Epitaxial Layer Thickness	0
Exposure Controllers	4
Film Thickness / Thickness Measurement	63
Flatness Measurement	8
Focused Ion Beam (FIB) Systems	4
IC Testers	8
Interferometers	6
Laser Cutters for Failure Analysis	2
Leak Detection Systems	16
Line Width / Critical Dimension (CD) Measurement	13
Mask / Recticle Comparators	2
Metrology	103
Optical Pyrometers	9
Overlay Measurement	9
Ozone Monitors	7
Photoresist Development Rate Monitors	3
Sectioning Equipment	2
Spectrometers	21
Spreading Resistance Probes	0
Surface Particle Scanners	5
Surface Profiling / Profilometers	11
Wafer Particle Analysis	3
Weight Measurement / Precision Scales	1
X-Ray / XRF Systems	34

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