| Analytical Equipment |
51 |
| Bench Top Tests |
13 |
| Calibration Standards |
17 |
| Capacitance-to-Voltage (C-V) Plotters |
1 |
| Capacitance-to-Voltage (C-V) Probe Systems |
7 |
| Chromatography |
5 |
| Computer Aided Measuring and Analysis (CAMA) |
1 |
| Contour Mapping Systems |
1 |
| Defect / Particle Detection or Inspection |
37 |
| Deposition Rate Monitors |
4 |
| Ellipsometers |
5 |
| Endpoint Detectors |
6 |
| Exposure Controllers |
4 |
| Film Thickness / Thickness Measurement |
63 |
| Flatness Measurement |
8 |
| Focused Ion Beam (FIB) Systems |
4 |
| IC Testers |
8 |
| Interferometers |
6 |
| Laser Cutters for Failure Analysis |
2 |
| Leak Detection Systems |
15 |
| Line Width / Critical Dimension (CD) Measurement |
13 |
| Mask / Recticle Comparators |
2 |
| Metrology |
100 |
| Optical Pyrometers |
9 |
| Overlay Measurement |
9 |
| Ozone Monitors |
8 |
| Photoresist Development Rate Monitors |
3 |
| Sectioning Equipment |
2 |
| Spectrometers |
21 |
| Surface Particle Scanners |
5 |
| Surface Profiling / Profilometers |
11 |
| Wafer Particle Analysis |
3 |
| Weight Measurement / Precision Scales |
1 |
| X-Ray / XRF Systems |
34 |