Probe cards, DUT boards, and probing boards are all interfaces found on a semiconductor. They provide electrical pathways from one area of the semiconductor device to another. They all focus on communication and allow for the semiconductor to function as a whole. They work between test systems and wafers or integrated circuits.

Probe cards are designed to for the sole purpose of providing a pathway from the test system to the wafer. This is done normally before packaging, allowing for necessary tests to occur on the wafer level before further assembly is done. The probe card will contain a printed circuit board and a contact element. The probe card is placed into a wafer probe which allows for contact between the card and the wafer. The three different types of probe cards are MEMS type, needle type, and vertical type, with MEMS being the most advanced of the three. 

DUT boards, on the other hand, are printed circuit boards themselves. DUT stands for device under test, which is actually refers to the circuit that is being tested. It tests the integrated circuit and attach to automatic test equipment in order to create this interface. DUT boards have versatility in their uses, including testing specific equipment or chips or testing the individual chips on a silicon wafer. They can also be used in testing packaged semiconductor chips.

These different test equipments all contribute to assuring the functionality of the semiconductor before moving onto the finishing touches. DUT boards, and probing boards work as printed circuit boards to test the integrated circuits while probing cards test the functionality of the wafer. Each test that these pieces of equipment fulfill make it possible to have an ideal wafer before sending it on to be packaged. Without them, the whole semiconductor would fall apart.