The TESCAN targets for 2009 are varied however all aim to strengthening TESCAN position and reputation among the leading companies in the electron microscopy branch. Starting operation in new facilities allows not only increasing production capacity but also further improvement of the manufacturing and technological conditions.  After the successful introduction of TESCAN Focused Ion Beam Field Emission Scanning Electron Microscope provided with different tools like Gas Injection System, Nano-manipulators, EDX and EBSD systems as well as very interesting software options TESCAN came with VEGA II EasyProbe device – combination of SEM and fully integrated EDX microanalyser that offers reliable solution for routine applications. Tungsten filament based SEM VEGA InduSEM is a compact and transportable scanning electron microscope for a comprehensive sample examination and high-resolution quality control of any kind of material. The third generation of TESCAN tungsten filament as well as Schottky emitter based scanning electron microscopes appears in these days.

Also TESCAN participation in the FIBLYS project for designing and building united  nano-structuring, nano-manipulation, nano-analytic and nano-vision capabilities in one unique “multi-nano” tool is an important part of TESCAN activities in 2009.