Semiconductor buyers guide, directory and reference site.

 

 

E+H Metrology GmbH - Wafer Inspection System Suppliers

 

Company : E+H Metrology GmbH

Address 1 : Benzstrasse 5 - 9

Address 2 :

City : Karlsruhe

State :

Post/Zip Code : D-76185

Country : Germany

Phone : +49 721 831180

Fax :

 

Email : info@eh-metrology.com

 

 

Industry Memberships:
SEMI Member

 

Description :

E+H produces since more than 40 years a large variety of metrology tools capable to measure

  • Thickness
  • Flatness, TTV
  • Warp/Bow
  • FPD
  • Resistivity, RRV
  • Sheet Resistance
  • Film Stress
  • Waviness
  • Roughness
  • P/N
  • ...and more

of Semiconductor and PV Wafers.

E+H has a worldwide distributor and service network to advice and support you locally where you need us.

Literature

Products

Geometry, Thickness, TTV and Stress Measurement
Geometry, Thickness, TTV and Stress Measurement

Product Code: MX 203 / MX 204

More Information
Literature

Literature

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