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MTI Instruments Inc. - Wafer Inspection System Suppliers

 

Company : MTI Instruments Inc.

Address 1 : 325 Washington Ave. Extension

Address 2 :

City : Albany

State : NY

Post/Zip Code : 12205-5582

Country : United States

 

Phone : +1 518 218 255

Fax : +1 518-218-2506

 

Email : mtiinstruments@mechtech.com

 

Visit MTI Instruments Inc. Website

 

 

Description :

Proforma 300

Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.

Proforma 200SA

Semi-automated, full wafer surface scanning for thickness, TTV, bow, warp, site and global flatness measurement. The Proforma 200SA can be used for all wafer materials and accommodates wafer diameters of 75 - 200 mm.

 

Proforma 300SA

Semi-automated wafer characterization system for determining wafer thickness, TTV, bow warp, site and global flatness measurement. The Proforma 300SA can be used for all wafer materials and accommodates 200mm and 300mm wafer diameters.

 

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