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MTI Instruments Inc. - Wafer Inspection System Suppliers
Company : MTI Instruments Inc.
Address 1 : 325 Washington Ave. Extension
Address 2 :
City : Albany
State : NY
Post/Zip Code : 12205-5582
Country : United States
Phone : +1 518 218 255
Fax : +1 518-218-2506
Email : mtiinstruments@mechtech.com
Industry Memberships:
Description :
Proforma 300
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
Proforma 200SA
Semi-automated, full wafer surface scanning for thickness, TTV, bow, warp, site and global flatness measurement. The Proforma 200SA can be used for all wafer materials and accommodates wafer diameters of 75 - 200 mm.
Proforma 300SA
Semi-automated wafer characterization system for determining wafer thickness, TTV, bow warp, site and global flatness measurement. The Proforma 300SA can be used for all wafer materials and accommodates 200mm and 300mm wafer diameters.
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